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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Portable Test System
MT786
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Environmental Test Chambers
An enclosure used to test the effects of specified environmental conditions on biological items, industrial products, materials, and electronic devices and components.
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Three Phase Secondary Current Injection Test Set
TEST-330B
Beijing GFUVE Electronics Co.,Ltd.
Three phase secondary current injection test set is testing relay set, protective device, instruments, output ac dc current and voltage source, embedded Window XP system.
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Custom Test Design
Materials Evaluation and Engineering
Some problems require solutions beyond the standard test methods and procedures routinely performed at MEE. Replicating the suspected cause of failure on an exemplar part can provide valuable information about the likelihood of that failure case. Likewise, intentionally causing component failures in a variety of ways can provide insight into possible failure scenarios. Wondering how (or if) a design or part can be tested? Give us a call – the engineers and technicians at MEE enjoy the hands-on experience of designing customized testing plans for your unique challenges.
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Virtual Test Methodology
TVT
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
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SMD Test Fixture
16034G
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a compl...show more -
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Connector Test
A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Standard Test Finger
SMT-1
It with Protection against electric shock device. It according to IEC60335, IEC60884, IEC61032, IEC60529, IEC60065, IEC60035, IEC60950, EN60529, EN60950, GB4706, GB7000, GB9706, UL507, VDE0470, etc.
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RMI Test Panel
TA-1070
This is an RMI tester built to duplicate the original model 970E-1 unit. The panel is laid out just like the 970E-1 with an additional interface for our TA-568 to allow distance testing on the BDI-36 RMI. This panel incorporates both SIN/COS and 3 wire synchro outputs. With the use of our TA-900 API the bootstrap and other synchros can be aligned.
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Protection Relay Test Set
HT-802 / 301
Wuhan Huatian Electric Power Automation Co., Ltd.
Special instrument for microcomputer relay protection test of microcomputer industrial control machine.
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Desktop Meter Test Station
2990
The 2990 revolutionizes meter testing by providing full series parallel meter testing in a small, budget-friendly desktop package.
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Test Software
Elektra
The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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Stability and Shelf Life Test Chambers / Rooms
Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
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Test Fixtures & Jigs
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Test System
LB301
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Computer controlled tabletop tensile test stand 95TM - 30" travel
95TM
The ComTouch controller reports current reading, force results, test stand direction, limit switch warnings, test stand speed, and error messages. Designed to be rugged, sturdy, and easy-to-use, this test stand is built to last. Just select from our wide line of fixtures for standard tensile testing or install an optional compression cage for testing in compression.
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Product Test & Measurement Development Software tools
Tequra Requirements
Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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EW System Test Set
MS 1107
PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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HV AC Voltage Test Systems
Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of po...show more -
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Test & Measurement Platform
Konrad System Manager
The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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Test Equipment
Flexible Coil Current Sensor
*Analysis of harmonics, power measurements*Very high-current monitoring*Measuring starting transients of electric motors*Sudden short circuit testing*Arc furnace currents*High-current monitoring of switch-gear and fuses*Data logging*Can be measured by popular multi-meter
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Dial Up Modem Test
ModemTest 1.3
Test your dial up modem and telephone line for errors and connection speed. A local loopback test is provided as well as a master / slave test. The master / slave test requires 2 modems and 2 telephone lines. ModemTest is compatible with most dial up modems. (9.6 - 56Kbits)
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PC Based Test Setup for LED Driver of LED
The tests are Performed as Prescribed in IS the Panel Carries out high voltage, open circuit and performance tests, one by one and provides indication of the Test results as PASS or FAIL lamp for high voltage test. It is very useful and handy in line testing on Mass production line as well as type Testing. Special fixture can be provided for the specific product. This avoids the connections & disconnections of the product for different tests. The total time for entire testing is less than 80 seconds. Micro controller based sequential timer maintains the sequence of operation and displays the test status. The entire system is housed in sturdy M.S cabinet with powder coating.
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PD Conformance Test Suite
Sifos Technologies offers the ultimate simplicity in testing a PD’s conformance to IEEE 802.3 Standards with Pass/ Fail reporting in the PD Conformance Test Suite available for purchase with the PDA-600 Family of Instruments.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
